IP-4472 / Connected engineering
Garmo Fab Intelligence / Yield Platform
Wafer/process/test/yield ingestion, excursion/root-cause analysis, predictive yield and feedback to process/design optimization.
A defined role.
A precise boundary.
Bind Garmo Fab Intelligence / Yield Platform to the existing Silicon Graph and the selected Foundry OS/model/evidence contracts. Do not duplicate the platform or infer cross-domain qualification.
- Canonical identity
- IP-4472
- Scope
- Wafer/process/test/yield ingestion, excursion/root-cause analysis, predictive yield and feedback to process/design optimization.
- Runtime & availability
- Not a downloadable executable in this website package. Use the module to scope an existing GSP integration or request a controlled release.
- Evidence
- Canonical engineering scope is recorded. Executable, physical and external qualification evidence must be bound to the selected implementation release.
- Source
- Bible v7.42, section 123, IP-4472
Related engineering.
Garmo Manufacturing Compiler
OPC, inverse lithography, source-mask optimization, multi-patterning, curvilinear support, DFM, mask-data prep and process-simulation interfaces.
IP-4466Garmo Silicon World Model
Calibrated multi-fidelity cross-domain model hierarchy spanning design, process, package, manufacturing and measured silicon with uncertainty/sensitivity.
IP-4467Garmo Recursive Silicon
Closed-loop architecture/design candidate generation, legal transformation, evaluation ladders, evidence retention and next-generation optimization.