IP-4460 / Systems & qualification
Compact-Model & PDK Characterization Factory
Measurement-to-compact-model and characterized PDK-view generation with fitting, corners, uncertainty and qualification.
Architecture programDiscuss this module
A defined role.
A precise boundary.
Bind Compact-Model & PDK Characterization Factory to the existing Silicon Graph and the selected Foundry OS/model/evidence contracts. Do not duplicate the platform or infer cross-domain qualification.
- Canonical identity
- IP-4460
- Scope
- Measurement-to-compact-model and characterized PDK-view generation with fitting, corners, uncertainty and qualification.
- Runtime & availability
- Not a downloadable executable in this website package. Use the module to scope an existing GSP integration or request a controlled release.
- Evidence
- Canonical engineering scope is recorded. Executable, physical and external qualification evidence must be bound to the selected implementation release.
- Source
- Bible v7.42, section 123, IP-4460
Related engineering.
IP-4455
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Hybrid-bonding, die/chiplet/package physical, electrical, thermal, mechanical, test and manufacturing co-design.
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Instrument-aware experiment planning/execution, calibration, measurement provenance and closed-loop semiconductor laboratory automation.
IP-4457Computational Metrology
Measurement reconstruction, defect/feature extraction, uncertainty, correlation and model calibration from semiconductor metrology data.